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    "slug": "laboratorium-mikroskopii-elektronowej",
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    "link": "https:\/\/nanotech.fuw.edu.pl\/en\/?page_id=318",
    "title": {
        "rendered": "Laboratorium Mikroskopii Elektronowej"
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    "content": {
        "rendered": "<p>Pracownicy laboratorium:<\/p>\n<p><a href=\"https:\/\/nanotech.fuw.edu.pl\/en\/?page_id=5#Mateusz_Tokarczyk\">dr Mateusz Tokarczyk<\/a><\/p>\n<p><a href=\"https:\/\/nanotech.fuw.edu.pl\/en\/?page_id=5#Marta_Bilska\">mgr Marta Bilska<\/a><\/p>\n\n\n<p><strong>Mikroskop elektronowy Dual Beam HELIOS NanoLab 600<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"453\" height=\"340\" src=\"http:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2.jpg\" alt=\"\" class=\"wp-image-24\" style=\"width:649px;height:auto\" srcset=\"https:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2.jpg 453w, https:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2-300x225.jpg 300w\" sizes=\"auto, (max-width: 453px) 100vw, 453px\" \/><\/figure>\n\n\n<p>Dwuwi\u0105zkowy mikroskop SEM\/Ga-FIB firmy FEI umo\u017cliwia w jednym urz\u0105dzeniu wykorzystanie wi\u0105zki elektron\u00f3w i jon\u00f3w.<\/p>\n<p>Kolumna SEM (scanning electron microscope) s\u0142u\u017cy do obrazowania w wysokiej rozdzielczo\u015bci, a kolumna FIB (focus ion beam) umo\u017cliwia obr\u00f3bk\u0119 powierzchni pr\u00f3bki.<\/p>\n<p>Dodatkowe wyposa\u017cenie:<\/p>\n<ul>\n<li>zestaw do litografii elektronowej RAITH ELPHY Quantum 6MHz<\/li>\n<li>system EDX (Energy dispersive X-ray) &#8211; umo\u017cliwia analiz\u0119 sk\u0142adu chemicznego pr\u00f3bki.<\/li>\n<\/ul>\n<p>Mo\u017cliwe wykorzystanie mikroskopu:<\/p>\n<ul>\n<li>ultrawysokorozdzielcze obrazowanie powierzchni preparatu<\/li>\n<li>tworzenie i analiza przekroj\u00f3w w nano- i mikroskali<\/li>\n<li>mo\u017cliwo\u015b\u0107 charakteryzacji szerokiego spektrum preparat\u00f3w przewodz\u0105cych i nieprzewodz\u0105cych<\/li>\n<li>trawienie powierzchni<\/li>\n<li>nanoszenie warstw<\/li>\n<li>preparatyka wysokiej jako\u015bci pr\u00f3bek dla transmisyjnej mikroskopii elektronowej (TEM)<\/li>\n<li>wytwarzanie nanostruktur za pomoc\u0105 zestawu do litografii elektronowej.<\/li>\n<\/ul>\n<p>The FEI dual beam SEM\/Ga-FIB microscope is a instrument that combines the power of electron beams and ion beams within a single device.<\/p>\n<p>The scanning electron microscope (SEM) column is used for high-resolution imaging, while the focus ion beam (FIB) column allows the surface of the sample to be treated.<\/p>\n<p>Additional equipment:<\/p>\n<ul>\n<li>electron lithography RAITH ELPHY Quantum 6MHz<\/li>\n<li>system EDX (Energy dispersive X-ray) &#8211; enables chemical analysis of the sample.<\/li>\n<\/ul>\n<p>APPLICATIONS<\/p>\n<ul>\n<li>The ultra-high-resolution imaging of surface preparation.<\/li>\n<li>Creation and analysis cross-sections in nano- and microscale.<\/li>\n<li>The ability to characterize a wide range of formulations of conductive and non-conductive.<\/li>\n<li>Etching<\/li>\n<li>Metal and other materials deposition.<\/li>\n<li>Preparation of high-quality TEM samples.<\/li>\n<li>Fabrication of nanostructures using electron lithography.<\/li>\n<\/ul>",
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        "rendered": "<p>Pracownicy laboratorium: dr Mateusz Tokarczyk mgr Marta Bilska Mikroskop elektronowy Dual Beam HELIOS NanoLab 600 Dwuwi\u0105zkowy mikroskop SEM\/Ga-FIB firmy FEI umo\u017cliwia w jednym urz\u0105dzeniu wykorzystanie wi\u0105zki elektron\u00f3w i jon\u00f3w. Kolumna SEM (scanning electron microscope) s\u0142u\u017cy do obrazowania w wysokiej rozdzielczo\u015bci, a kolumna FIB (focus ion beam) umo\u017cliwia obr\u00f3bk\u0119 powierzchni pr\u00f3bki. Dodatkowe wyposa\u017cenie: zestaw do litografii [&hellip;]<\/p>",
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