{"id":233,"date":"2024-02-27T12:29:16","date_gmt":"2024-02-27T11:29:16","guid":{"rendered":"https:\/\/nanotech.fuw.edu.pl\/?page_id=233"},"modified":"2024-02-27T17:15:47","modified_gmt":"2024-02-27T16:15:47","slug":"digital-instruments-multimode-afm-2","status":"publish","type":"page","link":"https:\/\/nanotech.fuw.edu.pl\/?page_id=233","title":{"rendered":"Digital Instruments MultiMode AFM-2"},"content":{"rendered":"

Pracownicy odpowiedzialni:<\/p>\n

mgr Rafa\u0142 Bo\u017cek<\/a><\/p>\n

dr Jan Paw\u0142owski<\/a><\/p>\n\n

Mikroskop MultiMode umo\u017cliwia obrazowanie pr\u00f3bek w zakresie w powietrzu.<\/p>\n\n\n

\n
\n
\"\"<\/figure>\n<\/div>\n\n\n\n
\n
\"\"<\/figure>\n<\/div>\n<\/div>\n\n\n

Dost\u0119pne tryby pracy:<\/p>\n

    \n
  • topografia w trybie kontaktowym i trybie przerywanego kontaktu (\u201etapping mode\u201d),<\/li>\n
  • mikroskopia si\u0142 elektrycznych (EFM),<\/li>\n
  • mikroskopii si\u0142 magnetycznych (MFM),<\/li>\n
  • mapowania potencja\u0142u elektrycznego sond\u0105 Kelvina,<\/li>\n
  • mikroskopia si\u0142 bocznych (LFM),<\/li>\n
  • skaningowej mikroskopii tunelowej (STM).<\/li>\n<\/ul>\n

    Maksymalny rozmiar pr\u00f3bek:<\/p>\n

    \u00d8\u00a0\u226415 mm, grubo\u015b\u0107 ~5mm.<\/p>\n

    Mikroskop ma wymienne skanery piezoelektryczne:<\/p>\n

      \n
    • Skaner J (tzw. d\u0142ugi skaner) zakres pracy\u00a0x<\/em>,\u00a0y<\/em>: 125\u00a0\u00b5m i\u00a0z<\/em>: 5\u00a0\u00b5m.<\/li>\n
    • Skaner E (tzw. kr\u00f3tki skaner) zakres pracy\u00a0x<\/em>,\u00a0y<\/em>: 10\u00a0\u00b5m i\u00a0z<\/em>: 2,5\u00a0\u00b5m.<\/li>\n
    • Skaner A (tzw. kr\u00f3tki skaner) zakres pracy\u00a0x<\/em>,\u00a0y<\/em>: 0,4\u00a0\u00b5m i\u00a0z<\/em>: 0,4\u00a0\u00b5m.<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"

      Pracownicy odpowiedzialni: mgr Rafa\u0142 Bo\u017cek dr Jan Paw\u0142owski Mikroskop MultiMode umo\u017cliwia obrazowanie pr\u00f3bek w zakresie w powietrzu. Dost\u0119pne tryby pracy: topografia w trybie kontaktowym i trybie przerywanego kontaktu (\u201etapping mode\u201d), mikroskopia si\u0142 elektrycznych (EFM), mikroskopii si\u0142 magnetycznych (MFM), mapowania potencja\u0142u elektrycznego sond\u0105 Kelvina, mikroskopia si\u0142 bocznych (LFM), skaningowej mikroskopii tunelowej (STM). Maksymalny rozmiar pr\u00f3bek: \u00d8\u00a0\u226415 […]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":229,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-233","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/233","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=233"}],"version-history":[{"count":7,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/233\/revisions"}],"predecessor-version":[{"id":269,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/233\/revisions\/269"}],"up":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/229"}],"wp:attachment":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=233"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}