{"id":318,"date":"2024-02-28T11:57:43","date_gmt":"2024-02-28T10:57:43","guid":{"rendered":"https:\/\/nanotech.fuw.edu.pl\/?page_id=318"},"modified":"2026-05-21T13:29:50","modified_gmt":"2026-05-21T11:29:50","slug":"laboratorium-mikroskopii-elektronowej","status":"publish","type":"page","link":"https:\/\/nanotech.fuw.edu.pl\/?page_id=318","title":{"rendered":"Laboratorium Mikroskopii Elektronowej"},"content":{"rendered":"<p>Pracownicy laboratorium:<\/p>\n<p><a href=\"https:\/\/nanotech.fuw.edu.pl\/?page_id=5#Mateusz_Tokarczyk\">dr Mateusz Tokarczyk<\/a><\/p>\n<p><a href=\"https:\/\/nanotech.fuw.edu.pl\/?page_id=5#Marta_Bilska\">mgr Marta Bilska<\/a><\/p>\n\n\n<p class=\"wp-block-paragraph\"><strong>Mikroskop elektronowy Dual Beam HELIOS NanoLab 600<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"453\" height=\"340\" src=\"http:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2.jpg\" alt=\"\" class=\"wp-image-24\" style=\"width:649px;height:auto\" srcset=\"https:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2.jpg 453w, https:\/\/nanotech.fuw.edu.pl\/wp-content\/uploads\/2023\/05\/Obraz2-300x225.jpg 300w\" sizes=\"auto, (max-width: 453px) 100vw, 453px\" \/><\/figure>\n\n\n<p>Dwuwi\u0105zkowy mikroskop SEM\/Ga-FIB firmy FEI umo\u017cliwia w jednym urz\u0105dzeniu wykorzystanie wi\u0105zki elektron\u00f3w i jon\u00f3w.<\/p>\n<p>Kolumna SEM (scanning electron microscope) s\u0142u\u017cy do obrazowania w wysokiej rozdzielczo\u015bci, a kolumna FIB (focus ion beam) umo\u017cliwia obr\u00f3bk\u0119 powierzchni pr\u00f3bki.<\/p>\n<p>Dodatkowe wyposa\u017cenie:<\/p>\n<ul>\n<li>zestaw do litografii elektronowej RAITH ELPHY Quantum 6MHz<\/li>\n<li>system EDX (Energy dispersive X-ray) &#8211; umo\u017cliwia analiz\u0119 sk\u0142adu chemicznego pr\u00f3bki.<\/li>\n<\/ul>\n<p>Mo\u017cliwe wykorzystanie mikroskopu:<\/p>\n<ul>\n<li>ultrawysokorozdzielcze obrazowanie powierzchni preparatu<\/li>\n<li>tworzenie i analiza przekroj\u00f3w w nano- i mikroskali<\/li>\n<li>mo\u017cliwo\u015b\u0107 charakteryzacji szerokiego spektrum preparat\u00f3w przewodz\u0105cych i nieprzewodz\u0105cych<\/li>\n<li>trawienie powierzchni<\/li>\n<li>nanoszenie warstw<\/li>\n<li>preparatyka wysokiej jako\u015bci pr\u00f3bek dla transmisyjnej mikroskopii elektronowej (TEM)<\/li>\n<li>wytwarzanie nanostruktur za pomoc\u0105 zestawu do litografii elektronowej.<\/li>\n<\/ul>\n<p>The FEI dual beam SEM\/Ga-FIB microscope is a instrument that combines the power of electron beams and ion beams within a single device.<\/p>\n<p>The scanning electron microscope (SEM) column is used for high-resolution imaging, while the focus ion beam (FIB) column allows the surface of the sample to be treated.<\/p>\n<p>Additional equipment:<\/p>\n<ul>\n<li>electron lithography RAITH ELPHY Quantum 6MHz<\/li>\n<li>system EDX (Energy dispersive X-ray) &#8211; enables chemical analysis of the sample.<\/li>\n<\/ul>\n<p>APPLICATIONS<\/p>\n<ul>\n<li>The ultra-high-resolution imaging of surface preparation.<\/li>\n<li>Creation and analysis cross-sections in nano- and microscale.<\/li>\n<li>The ability to characterize a wide range of formulations of conductive and non-conductive.<\/li>\n<li>Etching<\/li>\n<li>Metal and other materials deposition.<\/li>\n<li>Preparation of high-quality TEM samples.<\/li>\n<li>Fabrication of nanostructures using electron lithography.<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"<p>Pracownicy laboratorium: dr Mateusz Tokarczyk mgr Marta Bilska Mikroskop elektronowy Dual Beam HELIOS NanoLab 600 Dwuwi\u0105zkowy mikroskop SEM\/Ga-FIB firmy FEI umo\u017cliwia w jednym urz\u0105dzeniu wykorzystanie wi\u0105zki elektron\u00f3w i jon\u00f3w. Kolumna SEM (scanning electron microscope) s\u0142u\u017cy do obrazowania w wysokiej rozdzielczo\u015bci, a kolumna FIB (focus ion beam) umo\u017cliwia obr\u00f3bk\u0119 powierzchni pr\u00f3bki. Dodatkowe wyposa\u017cenie: zestaw do litografii [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":8,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-318","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/318","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=318"}],"version-history":[{"count":12,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/318\/revisions"}],"predecessor-version":[{"id":526,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/318\/revisions\/526"}],"up":[{"embeddable":true,"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=\/wp\/v2\/pages\/8"}],"wp:attachment":[{"href":"https:\/\/nanotech.fuw.edu.pl\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=318"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}